The GD90 Trace GDMS instrument combines a proven optical platform with advanced electronics for highly accurate and reliable elemental analysis. Controlled entirely by computer, it provides a streamlined user experience with seamless USB connectivity to control, acquisition, and processing systems. This versatile instrument also includes remote-control capabilities and hardware-based acquisition control, offering a complete, user-friendly solution for high-precision elemental analysis.
Our GD90 Trace system enables full elemental analysis in one scan, detecting concentrations from major components (wt%) down to ultra-trace levels (ppb and sub-ppb). This direct solid-sampling method eliminates the need for chemical digestion, saving time and maintaining sample integrity.
The GD90 Trace offers continuously adjustable high-resolution capabilities ranging from <400 to >10,000 RP, meeting diverse analytical needs. Dual collectors provide a wide dynamic range, spanning up to 12 orders of magnitude.
Ideal for depth profiling in layered materials, the GD90 Trace performs highly sensitive trace-element distribution analysis without interference from matrix effects. Calibration is simplified using standard Relative Sensitivity Factors (RSF), avoiding the need for matrix-matched standards.
Our dedicated GDMS team brings over 35 years of combined experience, providing in-depth operational and analytical training tailored to each customer’s needs. With this expertise, we support both instrument and application development to help customers maximize the potential of GDMS technology.
Explore our GDMS Technology, GD90 Trace Applications, and Time-Resolved Analysis pages to learn more.
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