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GD90 Trace: Next-Generation Glow Discharge Mass Spectrometry (GDMS)

The GD90 Trace GDMS instrument combines a proven optical platform with advanced electronics for highly accurate and reliable elemental analysis. Controlled entirely by computer, it provides a streamlined user experience with seamless USB connectivity to control, acquisition, and processing systems. This versatile instrument also includes remote-control capabilities and hardware-based acquisition control, offering a complete, user-friendly solution for high-precision elemental analysis.

Unmatched Elemental Analysis

Our GD90 Trace system enables full elemental analysis in one scan, detecting concentrations from major components (wt%) down to ultra-trace levels (ppb and sub-ppb). This direct solid-sampling method eliminates the need for chemical digestion, saving time and maintaining sample integrity. 

Exceptional Resolution and Dynamic Range

 The GD90 Trace offers continuously adjustable high-resolution capabilities ranging from <400 to >10,000 RP, meeting diverse analytical needs. Dual collectors provide a wide dynamic range, spanning up to 12 orders of magnitude. 

Depth Profiling and Minimal Matrix Effects

 Ideal for depth profiling in layered materials, the GD90 Trace performs highly sensitive trace-element distribution analysis without interference from matrix effects. Calibration is simplified using standard Relative Sensitivity Factors (RSF), avoiding the need for matrix-matched standards. 

Key Features of the GD90 Trace

  • Optimized Cell Construction: Durable tantalum cells and source construction simplify cleaning and maintenance. 

  • Cryo-Cooling: Optional cryo-cooling of the GD cell reduces gas background, enhancing detection accuracy. 

  • Flexible Sample Accommodation: Designed for both pin and flat cell geometries, adaptable to a variety of sample types .

  • No Mass Bias: Delivers unbiased results for light and heavy elements alike. 

  • Efficient Calibration: Calibration involves a quick check of 180Ta and 181Ta, ensuring consistency between the IC and Faraday detectors. 

  • Low Gas Flow Requirements: Optimized for cost-efficient operation using alternative ionization gases, including krypton. . 

  • Versatile Sample Compatibility: Analyzes a wide range of samples, from alloys to high-purity materials, in various sample geometries. 

  • Low Sputter Rate: Under standard conditions, sputter rates range from 150 nm/min (conductive materials) to 100 nm/min (non-conductive materials), with adjustable rates for more precise analysis.  

  • Reliable Detection Limits and RSFs: Detection limits and RSFs are based on well-documented, widely accessible methodologies.  

  • Customizable Design for Specialized Applications: Front-end assembly can accommodate a custom glove box for specialized applications, such as nuclear material analysis. 

Expert GDMS Support and Training

Our dedicated GDMS team brings over 35 years of combined experience, providing in-depth operational and analytical training tailored to each customer’s needs. With this expertise, we support both instrument and application development to help customers maximize the potential of GDMS technology. 

 

Explore our GDMS Technology, GD90 Trace Applications, and Time-Resolved Analysis pages to learn more.

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